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International Journal of Photoenergy
Volume 2010 (2010), Article ID 476589, 4 pages
Research Article

Preparation and Characterization of Thin Films by Coevaporation

College of Materials Science and Engineering, Sichuan University, Chengdu 610064, China

Received 3 April 2010; Accepted 23 June 2010

Academic Editor: Leonardo Palmisano

Copyright © 2010 Bin Lv et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


Deposition of thin films on soda-lime glass substrates by coevaporation of Sb and Te is described in this paper. thin films were characterized by x-ray diffraction (XRD), x-ray fluorescence (XRF), atomic force microscopy (AFM), x-ray photoelectron spectroscopy (XPS), electrical conductivity measurements, and Hall measurements. The abnormal electrical transport behavior occurred from in situ electrical conductivity measurements. The results indicate that as-grown thin films are amorphous and undergo an amorphous-crystalline transition after annealing, and the posttreatment can effectively promote the formation of Sb-Te bond and prevent oxidation of thin film surface.