Journals
Publish with us
Publishing partnerships
About us
Blog
International Journal of Photoenergy
Journal overview
For authors
For reviewers
For editors
Table of Contents
Special Issues
International Journal of Photoenergy
/
2011
/
Article
/
Fig 3
/
Research Article
Studying the Properties of RF-Sputtered Nanocrystalline Tin-Doped Indium Oxide
Figure 3
XRD patterns for ITO thin films deposited using RF power value 200 W for 40 min deposition time: (a) without, (b) with heat treatment at 400°C for 1 h.