Indium-Doped Zinc Oxide Thin Films as Effective Anodes of Organic Photovoltaic Devices
Figure 3
(a) Scanning electron microscope (SEM) image of IZO film prepared by ultrasonic spray pyrolysis. The topography of (b) IZO-coated glass and (c) ITO-coated glass substrates measured using atomic force microscopy (AFM). The root mean square surface roughness is 12.37 nm for IZO and 2.41 nm for ITO.
