Research Article
Fabrication of Cu–Zn–Sn–S–O Thin Films by the Electrochemical Deposition Method and Application to Heterojunction Cells
Table 1
Deposition potential, composition, thickness, and bandgap of the CZTSO thin films.
| Sample | Potential (V) | Cu (at %) | Zn (at %) | Sn (at %) | S (at %) | O (at %) | Thickness () | Bandgap (eV) |
| A |
V = −0.8
| 28.2 | 9.4 | 12.9 | 19.8 | 29.7 |
~0.5
| 2.1 | B |
V = −0.8~−0.5
| 28.4 | 11.3 | 8.8 | 30.9 | 20.6 |
~0.3
| 1.6 | C |
V = −0.9~−0.5
| 27.6 | 8.4 | 14.8 | 40.9 | 8.4 |
~0.3
| 1.6 | D |
V = −1.0~−0.5
| 22.6 | 16.3 | 13.0 | 28.8 | 19.2 |
~0.3
| 1.5 | E |
V = −1.1~−0.5
| 23.6 | 17.4 | 13.2 | 26.0 | 19.6 | ~0.3 | 1.6 |
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