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International Journal of Photoenergy
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International Journal of Photoenergy
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2012
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Article
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Tab 1
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Research Article
Photothermal Deflection Spectroscopy Study of Nanocrystalline Si (nc-Si) Thin Films Deposited on Porous Aluminum with PECVD
Table 1
Evolution of the bandgap energies.
PASL Sample
Anodisation current
(mA)
(eV)
PDS
(eV)
PL
A
200
2.2
2.2
B
250
2
1.99
C
300
2.01
1.9
D
350
1.95
1.98
E
400
1.93
1.97