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International Journal of Photoenergy
Volume 2012 (2012), Article ID 732647, 4 pages
http://dx.doi.org/10.1155/2012/732647
Research Article

Quinhydrone Chemical Passivation of a Silicon Surface for Minority Carrier Bulk-Lifetime Measurements

1Faculty of Electrical Engineering and Communication, Brno University of Technology, Technicka 10, 61600 Brno, Czech Republic
2Technology division, Solartec s.r.o., Televizni 2618, 756 61 Rožnov pod Radhoštěm, Czech Republic

Received 19 June 2011; Accepted 23 January 2012

Academic Editor: Bhushan Sopori

Copyright © 2012 M. Solcansky et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

M. Solcansky, J. Vanek, and A. Poruba, “Quinhydrone Chemical Passivation of a Silicon Surface for Minority Carrier Bulk-Lifetime Measurements,” International Journal of Photoenergy, vol. 2012, Article ID 732647, 4 pages, 2012. doi:10.1155/2012/732647