Quantification of Power Losses of the Interdigitated Metallization of Crystalline Silicon Thin-Film Solar Cells on Glass

<table>A focused-ion beam (FIB) image of the sidewall cross-section located at the emitter finger-BSF finger interface. A trench has been etched into the cell, and the sample tilted 45° to view the cross-section.</table>

International Journal of Photoenergy

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Figure 2

Figure 2: Quantification of Power Losses of the Interdigitated Metallization of Crystalline Silicon Thin-Film Solar Cells on Glass 