International Journal of Photoenergy / 2013 / Article / Fig 1

Research Article

Reliable and Damage-Free Estimation of Resistivity of ZnO Thin Films for Photovoltaic Applications Using Photoluminescence Technique

Figure 1

(a) PL spectrum of samples ZR, ZI, ZI-v, and ZI-va. (b) Variation of and resistivity for various treatments to a sample.
105796.fig.001a
(a)
105796.fig.001b
(b)

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