International Journal of Photoenergy / 2013 / Article / Fig 5

Research Article

Reliable and Damage-Free Estimation of Resistivity of ZnO Thin Films for Photovoltaic Applications Using Photoluminescence Technique

Figure 5

(a) PL spectrum of ZnO thin films prepared at different spray rates. (b) Gaussian fitting and FWHM of the NBE peak at 3.26 eV.

Article of the Year Award: Outstanding research contributions of 2020, as selected by our Chief Editors. Read the winning articles.