International Journal of Photoenergy / 2013 / Article / Fig 5

Research Article

Reliable and Damage-Free Estimation of Resistivity of ZnO Thin Films for Photovoltaic Applications Using Photoluminescence Technique

Figure 5

(a) PL spectrum of ZnO thin films prepared at different spray rates. (b) Gaussian fitting and FWHM of the NBE peak at 3.26 eV.
105796.fig.005a
(a)
105796.fig.005b
(b)

Article of the Year Award: Outstanding research contributions of 2020, as selected by our Chief Editors. Read the winning articles.