International Journal of Photoenergy / 2013 / Article / Fig 8

Research Article

Reliable and Damage-Free Estimation of Resistivity of ZnO Thin Films for Photovoltaic Applications Using Photoluminescence Technique

Figure 8

(a) Variation in intensity of green emission in the PL spectrum of In2S3 thin films on indium incorporation. (b) Variation of absolute intensity of green emission and resistivity of In2S3 thin films on indium incorporation drawn in a log scale.

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