Reliability Analysis of III-V Solar Cells Grown on Recycled GaAs Substrates and an Electroplated Nickel Substrate

Figure 6

The degradation faction of conversion efficiency for GaAs thin-film solar cell transferred to electroplated Ni substrate after thermal shock test (cycle time are 0, 800, 1200, and 1500 times). The insert is the I-V curve of thin-films GaAs solar cell with different thermal shock test times.