Reliability Analysis of III-V Solar Cells Grown on Recycled GaAs Substrates and an Electroplated Nickel Substrate
Figure 8
SEM images of the TF cell after the thermal shock test; (a) electrode pattern for the TF-cell; surface morphology images of the TF cell with amplification factors of (b) 3000×, (c) 5000×, and (d) 7000×.
