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International Journal of Photoenergy
Volume 2013 (2013), Article ID 158792, 7 pages
http://dx.doi.org/10.1155/2013/158792
Research Article

Radiation Hardness of Flash Memory Fabricated in Deep-Submicron Technology

1Life Robinson Private Hospital, Hospital Road, P.O. Box 37, Randfontein 1760, South Africa
2Faculty of Electrical Engineering, University of Belgrade, Bulevar Kralja Aleksandra 73, 11000 Belgrade, Serbia
3Faculty of Electronic Engineering, University of Niš, Aleksandra Medvedeva 14, 18000 Niš, Serbia

Received 5 April 2013; Accepted 25 May 2013

Academic Editor: Momčilo Pejović

Copyright © 2013 Bojan Cavrić et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

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