International Journal of Photoenergy / 2013 / Article / Fig 1

Research Article

Radiation Damage in Electronic Memory Devices

Figure 1

The average relative change in number of errors in irradiated EPROM samples (NM27C010) versus the absorbed dose of radiation: (a) differential; (b) cumulative (  bit, ).
170269.fig.001a
(a)
170269.fig.001b
(b)

Article of the Year Award: Outstanding research contributions of 2020, as selected by our Chief Editors. Read the winning articles.