International Journal of Photoenergy / 2013 / Article / Fig 2

Research Article

Radiation Damage in Electronic Memory Devices

Figure 2

The average relative change in number of errors in irradiated EEPROM samples (NM93CS46) versus the absorbed dose of radiation: (a) differential; (b) cumulative (  bit, ).
170269.fig.002a
(a)
170269.fig.002b
(b)

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