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International Journal of Photoenergy
Volume 2013 (2013), Article ID 925280, 9 pages
Research Article

Effect of Temperature and Humidity on the Degradation Rate of Multicrystalline Silicon Photovoltaic Module

1Components & Materials Physics Research Center, Korea Electronic Technology Institute, No. 68 Yaptap-dong, Bundang-gu, Seongnam-si, Gyeonggi-do 463-816, Republic of Korea
2Department of Materials Science and Engineering, Korea University, Anam-dong, Seongbuk-gu, Seoul 136-701, Republic of Korea

Received 2 October 2013; Accepted 14 November 2013

Academic Editor: Dionissios Mantzavinos

Copyright © 2013 N. C. Park et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


In a PV module, the relative humidity (rh) of a front encapsulant is different from that of a backside encapsulant (rhback). In this study, the effective humidity (rheff) in a PV module was investigated to study the effects of moisture variation on the degradation rate (). rheff represents uniform humidity in a PV module when it is exposed to certain damp heat conditions. Five types of accelerated tests were conducted to derive the relation between rheff and rhback. rheff showed a linear relationship with rhback at constant temperature. Two types of models, namely, Eyring and Peck models, were used for predicting the of PV modules, and their results were compared. The of PV modules was thermally activated at 0.49 eV. Furthermore, the temperature and rheff history of PV modules over one year were determined at two locations: Miami (FL, USA) and Phoenix (AZ, USA). The accumulated values based on the temperature and rheff of the modules were calculated by summing the hourly degradation amounts over the time history.