Very Fast and Accurate Procedure for the Characterization of Photovoltaic Panels from Datasheet Information

<table class="table-group" id="tab1"><tr><td><table class="table"><tr><td class="thead-hr" colspan="2"><hr/></td></tr><tr class="thead"><td align="left">Technology </td><td align="center"> # PV panels </td></tr><tr><td class="thead-hr" colspan="2"><hr/></td></tr><tr><td align="left">Mono-Si </td><td align="center"> 4801</td></tr><tr><td align="left">Multi-Si </td><td align="center"> 6435</td></tr><tr><td align="left">Amorphous and thin films </td><td align="center"> 253</td></tr><tr><td align="left">Other (CIS, CIGS, CdTe, etc.) </td><td align="center"> 275</td></tr><tr><td align="left" colspan="2"><hr/></td></tr><tr><td align="left"> Total </td><td align="center"> 11764</td></tr><tr class="table-tr"><td colspan="2"><hr class="tbody-hr"/></td></tr></table></td></tr></table>

Number of tested PV panels from CEC database grouped by type of technology.

International Journal of Photoenergy

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Table 1

Table 1: Very Fast and Accurate Procedure for the Characterization of Photovoltaic Panels from Datasheet Information 