Research Article

The Structure and Stability of Molybdenum Ditelluride Thin Films

Figure 1

XRD patterns of Mo-Te thin films annealed at different temperatures for 15 min in N2 ambient.
956083.fig.001a
(a)
956083.fig.001b
(b)
956083.fig.001c
(c)
956083.fig.001d
(d)
956083.fig.001e
(e)
956083.fig.001f
(f)