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International Journal of Photoenergy
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International Journal of Photoenergy
/
2017
/
Article
/
Tab 1
/
Research Article
An Analysis of ZnS:Cu Phosphor Layer Thickness Influence on Electroluminescence Device Performances
Table 1
x
,
y
CIE standard of EL devices using ZnS:Cu phosphor.
Thickness of ZnS:Cu phosphor
Lv
x
y
10
μ
m
45.78
0.1945
0.4698
30
μ
m
51.22
0.1923
0.4788
50
μ
m
42.58
0.1933
0.4651