Research Article
Nanostructured Dielectric Layer for Ultrathin Crystalline Silicon Solar Cells
Figure 5
(a) The simulation and experiment results of reflection for NDL on 40 μm thick unpolished c-Si. The incident light is at normal direction with wavelength ranging from 400 nm to 1000 nm. (b) The dependence of spectral averaged reflection (400 nm to 1000 nm, AM 1.5G) on incident angle for fabricated NDL on unpolished 40 μm c-Si.
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