Research Article
Efficiency Enhancement of Multicrystalline Silicon Solar Cells by Inserting Two-Step Growth Thermal Oxide to the Surface Passivation Layer
Figure 4
Carrier lifetime maps with respect to time: (a) sample A (without thermal oxidation) average carrier lifetime was 5.5 μs and (b) sample B (with thermal oxidation) average carrier lifetime was 21 μs.
(a) |
(b) |