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International Journal of Photoenergy
Volume 2018, Article ID 4381579, 6 pages
https://doi.org/10.1155/2018/4381579
Research Article

The Effect of Microcrack Length in Silicon Cells on the Potential Induced Degradation Behavior

1Beijing University of Technology, Beijing 100124, China
2CECEP Solar Energy Technology (Zhenjiang) Co., Ltd., Zhenjiang 212132, China
3Beijing Jiaotong University, Beijing 100044, China

Correspondence should be addressed to Hao Zhuang; nc.cescec@oahgnauhz

Received 26 October 2017; Accepted 9 January 2018; Published 18 February 2018

Academic Editor: Reyna Natividad-Rangel

Copyright © 2018 Xianfang Gou et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Xianfang Gou, Xiaoyan Li, Shaoliang Wang, Hao Zhuang, Xixi Huang, and Likai Jiang, “The Effect of Microcrack Length in Silicon Cells on the Potential Induced Degradation Behavior,” International Journal of Photoenergy, vol. 2018, Article ID 4381579, 6 pages, 2018. https://doi.org/10.1155/2018/4381579.