Silicon Powder-Based Wafers for Low-Cost Photovoltaics: Laser Treatments and Nanowire Etching

Figure 2

(a) SEM cross section image of the as-cut pc-Si sample subject to a polishing; (b) SEM cross section image of the laser-crystallized pc-Si sample (at a power density of 13.5 kW cm⁻²) and the inset showing another region; (c) cross-sectional EBSD mapping of the laser-recrystallized pc-wafer (at a power density of 13.5 kW cm⁻²).

(a)

(b)

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