Research Article
Research on Online Defect Detection Method of Solar Cell Component Based on Lightweight Convolutional Neural Network
Table 2
Positioning results of silicon wafer edge sorting.
| | Peak number from left to right | Peak coordinates | values | Peak number from up to bottom | Peak coordinates | values |
| | 1 | (10.29, 0) | 1249.91 | 1 | (0, 12.34) | 1372.56 | | 2 | (639.03, 0) | 2735.72 | 2 | (0, 647.63) | 4791.34 | | 3 | (1261.22, 0) | 3619.89 | 3 | (0, 1289.41) | 4601.41 | | 4 | (1896.51, 0) | 3063.19 | 4 | (0, 1931.31) | 4621.05 | | 5 | (2525.25, 0) | 2958.40 | 5 | (0, 2573.15) | 5079.51 | | 6 | (3167.09, 0) | 2683.32 | 6 | (0, 3221.53) | 3560.05 | | 7 | (3802.38, 0) | 3122.13 | 7 | (0, 3783.73) | 1601.79 | | 8 | (4437.67, 0) | 3036.99 | | | | | 9 | (5066.41, 0) | 2879.81 | | | | | 10 | (5714.81, 0) | 2945.30 | | | | | 11 | (6326.64, 0) | 2080.78 | | | |
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