Research Article
Properties of RF-Sputtered PZT Thin Films with Ti/Pt Electrodes
Table 1
Average residual stress and thermal stress in Pt/Ti layer annealed at different temperatures.
| Annealing temperature | Without annealing | 500°C | 600°C | 700°C |
| Radius of curvature: (mm) | 44035 | 5049 | 4169 | 4824 | Average residual stress: (MPa) | 85.6 | 747 | 904 | 781 | Thermal stress: (MPa) | 0 | 1320 | 1583 | 1874 |
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