Facile Synthesis of Hollow Carbon Nanospheres by Using Microwave Radiation

Table 3

The atomic percentages and peak positions of different elements obtained by XPS characterization of SiO₂@PPy NPs, samples after microwave, and Hollow C.

Elements	SiO2@PPy NPs	MW1	MW2	MW3	Hollow C
C peak (eV)	284.8	284.81	284.82	284.81	284.79
C (%)	75.4	57.76	55.44	70.09	78.85
O peak (eV)	532.63	533.03	532.99	532.81	532.2
O (%)	19.57	27.34	28.42	19.83	17.14
N peak (eV)	399.78	399.77	399.81	399.83	399.72
N (%)	1.53	6.09	6.26	6.15	2.02
Si peak (eV)	103.45	103.81	103.76	103.78	102.1
Si (%)	2.9	8.82	9.88	3.62	1.16