Power Characterisation for Fine-Grain Reconfigurable Fabrics

Table 3

Details of FPGAs used for our fabric characterisation experiment.

FPGA family	Device	Board	Process technology	Core voltage	Thermal resistance Θ𝐽𝐶	Number of LUTs/FFs	Number of RNGs	Logic utilisation
Xilinx Virtex-II Pro [9]	XC2VP30	XUP	130 nm	1.5 V	0.6°C/W	27,392	48	89.7%
Xilinx Spartan-3E [17]	XC3S500E	Spartan-3E Starter Kit	90 nm	1.2 V	9.8°C/W	9,312	16	88%
Xilinx Spartan-3AN [17]	XC3S700AN	Spartan-3AN Starter Kit	90 nm	1.2 V	5.3°C/W	11,776	21	91.3%
Xilinx Virtex-5 [23]	XC5VLX50T	ML505	65 nm	1.0 V	0.2°C/W	28,800	50	88.9%
Silicon Blue iCE65 [20]	iCE65L04	iCEman Eval Kit	65 nm	1.2 V	n/a	3,520	6	87.3%