Internal Due Date Assignment in a Wafer Fabrication Factory by an Effective Fuzzy-Neural Approach

Table 5

The results of the 𝑆-test.

Number of categories (𝐾)	𝐽𝑚	𝑒^2min	𝑆
2	1.96	0.14	0.34
3	1.21	0.09	0.34
4	0.86	0.07	0.30
5	0.67	0.06	0.26
6	0.53	0.03	0.43