Fault Modeling and Testing for Analog Circuits in Complex Space Based on Supply Current and Output Voltage

<div>2D collaborative fault model of the Sallen-Key filter. All potential fault statuses of the filter compose a family of <svg height="12.4257pt" id="M226" style="vertical-align:-3.427751pt" version="1.1" viewbox="-0.0498162 -8.99795 10.3618 12.4257" width="10.3618pt" xmlns="http://www.w3.org/2000/svg" xmlns:xlink="http://www.w3.org/1999/xlink"><g transform="matrix(.0135,0,0,-0.0135,0,0)"><path d="M584 650H137L131 622C214 614 217 612 200 521L125 127C109 41 101 35 23 28L17 0H288L294 28C201 35 193 42 209 128L242 309H348C440 309 442 300 443 226H471L510 422H482C452 354 449 348 357 348H251L295 575C302 609 304 615 338 615H426C502 615 517 604 526 581C534 560 536 524 537 492L565 494C574 554 583 631 584 650Z" id="g113-71"></path><glyph.data ascent="3473" descent="-2876" horiz-adv-x="607" vert-adv-y="607"></glyph.data></g><g transform="matrix(.0095,0,0,-0.0095,7.072,3.264)"><path d="M250 606C250 634 233 656 203 656C168 656 146 618 146 593C146 564 169 545 192 545C227 545 250 573 250 606ZM227 95L212 119C187 98 152 71 135 71C129 71 128 78 134 102L207 373C219 418 217 451 194 451C165 451 92 411 30 351L44 326C77 353 106 371 114 371C124 371 121 357 117 341L55 97C32 5 46 -12 70 -12C108 -12 191 51 227 95Z" id="g50-106"></path><glyph.data ascent="3443" descent="-2856" horiz-adv-x="280" vert-adv-y="280"></glyph.data></g></svg>-loci, and <svg height="12.4257pt" id="M227" style="vertical-align:-3.427751pt" version="1.1" viewbox="-0.0498162 -8.99795 10.3618 12.4257" width="10.3618pt" xmlns="http://www.w3.org/2000/svg" xmlns:xlink="http://www.w3.org/1999/xlink"><g transform="matrix(.0135,0,0,-0.0135,0,0)"><path d="M584 650H137L131 622C214 614 217 612 200 521L125 127C109 41 101 35 23 28L17 0H288L294 28C201 35 193 42 209 128L242 309H348C440 309 442 300 443 226H471L510 422H482C452 354 449 348 357 348H251L295 575C302 609 304 615 338 615H426C502 615 517 604 526 581C534 560 536 524 537 492L565 494C574 554 583 631 584 650Z" id="g113-71"></path><glyph.data ascent="3473" descent="-2876" horiz-adv-x="607" vert-adv-y="607"></glyph.data></g><g transform="matrix(.0095,0,0,-0.0095,7.072,3.264)"><path d="M250 606C250 634 233 656 203 656C168 656 146 618 146 593C146 564 169 545 192 545C227 545 250 573 250 606ZM227 95L212 119C187 98 152 71 135 71C129 71 128 78 134 102L207 373C219 418 217 451 194 451C165 451 92 411 30 351L44 326C77 353 106 371 114 371C124 371 121 357 117 341L55 97C32 5 46 -12 70 -12C108 -12 191 51 227 95Z" id="g50-106"></path><glyph.data ascent="3443" descent="-2856" horiz-adv-x="280" vert-adv-y="280"></glyph.data></g></svg>-loci converge in the fault free point A and zero point B.</div>

Journal of Applied Mathematics

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Figure 3

Figure 3: Fault Modeling and Testing for Analog Circuits in Complex Space Based on Supply Current and Output Voltage 