Grafting of Gold Nanoparticles on Glass Using Sputtered Gold Interlayers

Table 1

Element concentration in near surface layers measured by XPS method. Spectra were obtained for samples of gold sputtered for 20 and 200 s after dithiol treatment and AuNPs grafting. The measurements were performed at analytical beam incidence angles of 0° and 81° with respect to the sample surface normal.

Sample	Deposition time	Element concentration (at. %)
		C (1s)		O (1s)		Au (4f)		S (2p)
		Angle (°)
		0	81	0	81	0	81	0	81
Dithiol treated	20 s	57.9	68.8	14.3	1.2	23.2	18.4	4.6	11.6
	200 s	55.5	62.5	3.5	3.7	37.2	23.0	3.8	10.8
AuNPs grafted	20 s	48.6	67.3	18.4	1.2	28.9	25.2	4.1	6.3
	200 s	69.3	71.9	5.0	2.1	23.0	18.6	2.7	7.4