Journal of Crystallography / 2016 / Article / Fig 2

Research Article

Finite Element Simulation and X-Ray Microdiffraction Study of Strain Partitioning in a Layered Nanocomposite

Figure 2

(a) Depth-resolved reciprocal lattice spacing -distribution measured in the energy interval for reflection. (b) Line profiles corresponding to the stress-free NiAl and Cr lamellae at the surface (green open circles) and in the bulk of the composite (red filled squares). Thin vertical line in (b) is the theoretical value of the reciprocal lattice spacing taken from the literature for pure NiAl. The measured relaxed NiAl (Mo) lattice parameter differs from the one for pure NiAl due to the presence of Mo.
(a)
(b)

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