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Journal of Engineering
Volume 2016 (2016), Article ID 2456378, 8 pages
Research Article

Study on the AFM Force Curve Common Errors and Their Effects on the Calculated Nanomechanical Properties of Materials

1Young Researchers and Elite Club, Kermanshah Branch, Islamic Azad University, Kermanshah, Iran
2Medical Devices & Technology Group (MEDITEG), Faculty of Bioscience and Medical Engineering, Universiti Teknologi Malaysia, 81310 Skudai, Johor, Malaysia
3Department of Endodontics, School of Dentistry, Kermanshah University of Medical Sciences, Kermanshah, Iran
4Institute of Translational Medicine, University of Liverpool, Sherrington Building, Liverpool L69 3GE, UK
5Department of Orthopaedic Surgery (NOCERAL), Faculty of Medicine, University of Malaya, 50603 Kuala Lumpur, Malaysia

Received 12 August 2016; Accepted 29 September 2016

Academic Editor: Sheng-Rui Jian

Copyright © 2016 D. Almasi et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


The atomic force microscope (AFM) force curve has been widely used for determining the mechanical properties of materials due to its high resolution, whereby very low (piconewton) forces and distances as small as nanometers can be measured. However, sometimes the resultant force curve obtained from AFM is slightly different from those obtained from a more typical nanoindentation force curve due to the AFM piezo’s hysteresis. In this study the nanomechanical properties of either a sulfonated polyether ether ketone (SPEEK) treated layer or bare polyether ether ketone (PEEK) were evaluated via AFM nanoindentation and a nanomechanical test system to probe the possible error of the calculated nanomechanical properties due to the AFM piezo’s hysteresis. The results showed that AFM piezo’s hysteresis caused the error in the calculated nanomechanical properties of the materials.