Parametric Yield-Driven Resource Binding in High-Level Synthesis with Multi-Vth/Vdd Library and Device Sizing

Table 1

The profile of test benchmarks.

Name	Nodes number	Edges number	Add number	Mult number
CHEM	33	51	15	18
EWF	34	49	20	12
PR	44	132	26	16
WANG	52	132	26	24
MCM	96	250	64	30
HONDA	99	212	45	52
DIR	150	312	84	64
STEAM	222	470	105	115