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Journal of Electrical and Computer Engineering
Volume 2013, Article ID 189436, 10 pages
http://dx.doi.org/10.1155/2013/189436
Research Article

Novel Complete Probabilistic Models of Random Variation in High Frequency Performance of Nanoscale MOSFET

Department of Computer Engineering, Siam University, 38 Petchkasem Road, Bangkok 10160, Thailand

Received 27 September 2012; Revised 30 January 2013; Accepted 31 January 2013

Academic Editor: Jan Van der Spiegel

Copyright © 2013 Rawid Banchuin. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

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