Novel Complete Probabilistic Models of Random Variation in High Frequency Performance of Nanoscale MOSFET

Table 2

K-S test statistics.

From verification of		From Δ𝑓𝑇 verification of
pdfΔ𝐶𝑔 (𝛿𝐶𝑔)		pdfΔ𝑓𝑇(𝛿𝑓𝑇)
NMOS	PMOS	NMOS	PMOS
0.021463	0.016144	0.029223	0.029192