Applying the Analog Configurability Test Approach in a Wireless Sensor Network Application

Table 4

Resistor ladder test experimental results.

Parameter	Test condition	Min	Mean	Max
Voltage level available at the resistor ladder OA0; 𝑉OA0TAP  (AVCC units)	1	0.2505	0.2506	0.2510
	2	0.4999	0.5002	0.5006
	3	0.6247	0.6250	0.6256
	4	0.7497	0.7500	0.7507
	5	0.8122	0.8126	0.8132
	6	0.8742	0.8747	0.8750
	7	0.9368	0.9371	0.9382
Voltage level available at the resistor ladder OA1; 𝑉OA1TAP (AVCC units)	1	0.2505	0.2508	0.2510
	2	0.4999	0.5003	0.5006
	3	0.6247	0.6249	0.6256
	4	0.7492	0.7497	0.7502
	5	0.8117	0.8121	0.8122
	6	0.8730	0.8746	0.8750
	7	0.9355	0.9368	0.9372
Voltage level available at the resistor ladder OA2; 𝑉OA2TAP (AVCC units)	1	0.2498	0.2502	0.2505
	2	0.4996	0.5000	0.5001
	3	0.6247	0.6248	0.6249
	4	0.7497	0.7499	0.7507
	5	0.8117	0.8122	0.8127
	6	0.8730	0.8744	0.8747
	7	0.9355	0.9366	0.9372