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Journal of Electrical and Computer Engineering
Volume 2014, Article ID 410758, 9 pages
Research Article

Programmed Tool for Quantifying Reliability and Its Application in Designing Circuit Systems

Fundamental and Applied Sciences Department, Universiti Teknologi PETRONAS, Bandar Seri Iskandar, 31750 Tronoh, Perak, Malaysia

Received 19 January 2014; Revised 8 April 2014; Accepted 25 April 2014; Published 18 May 2014

Academic Editor: Muhammad Taher Abuelma'atti

Copyright © 2014 N. S. S. Singh. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


As CMOS technology scales down to nanotechnologies, reliability continues to be a decisive subject in the design entry of nanotechnology-based circuit systems. As a result, several computational methodologies have been proposed to evaluate reliability of those circuit systems. However, the process of computing reliability has become very time consuming and troublesome as the computational complexity grows exponentially with the dimension of circuit systems. Therefore, being able to speed up the task of reliability analysis is fast becoming necessary in designing modern logic integrated circuits. For this purpose, the paper firstly looks into developing a MATLAB-based automated reliability tool by incorporating the generalized form of the existing computational approaches that can be found in the current literature. Secondly, a comparative study involving those existing computational approaches is carried out on a set of standard benchmark test circuits. Finally, the paper continues to find the exact error bound for individual faulty gates as it plays a significant role in the reliability of circuit systems.