Impact of Interface Traps on Direct and Alternating Current in Tunneling Field-Effect Transistors

Figure 13

(a) Drain current at , (b) off-state at , , (c) calculated , and (d) versus ITs density at midgap band. The acceptor-type ITs deteriorates the on-state current which is the same effect at and .

(a)

(b)

(c)

(d)