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Journal of Nanomaterials
Volume 2007 (2007), Article ID 24242, 4 pages
http://dx.doi.org/10.1155/2007/24242
Research Article

Dielectric Resonator Method for Measuring the Electrical Conductivity of Carbon Nanotubes from Microwave to Millimeter Frequencies

1Electromagnetics Division, National Institute of Standards and Technology (NIST), Boulder 80305-3328, CO, USA
2Optoelectronics Division, National Institute of Standards and Technology (NIST), Boulder 80305-3328, CO, USA

Received 27 February 2007; Accepted 21 June 2007

Academic Editor: Christian Brosseau

Copyright © 2007 James Baker-Jarvis et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Abstract

We describe a dielectric resonator-based measurement method for determining the electrical conductivity of carbon nanotubes at microwave to millimeter frequencies. This measurement method is not limited by the metal conductor contact resistances or impedance mismatch commonly encountered in the measurement of single nanotubes. The measurement of carbon nanotubes yielded conductivities of approximately 0.08×107 S/m.