Research Article

Buckling of Single-Crystal Silicon Nanolines under Indentation

Figure 2

(a) Schematic of the nanoindentation test on parallel SiNLs. (b) A set of three load-displacement curves from the nanoindentation tests on the 74 nm SiNLs, with no residual deformation after unloading of the indenter.
132728.fig.002a
(a)
132728.fig.002b
(b)