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Journal of Nanomaterials
Volume 2008, Article ID 395490, 4 pages
Research Article

Enhancement of Ammonia Sensitivity in Swift Heavy Ion Irradiated Nanocrystalline Thin Films

1Thin Film Lab, Department of Physics, Indian Institute of Technology, New Delhi 110016, India
2Department of Physics, I.T.S. Engineering College, Greater Noida, Uttar Pradesh 201308, India
3Materials Science Division, Inter-University Accelerator Centre, Aruna Asaf Ali Marg, New Delhi 110075, India

Received 12 July 2008; Accepted 24 September 2008

Academic Editor: Rakesh Joshi

Copyright © 2008 Sanju Rani et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


Swift heavy ion irradiation is an effective technique to induce changes in the microstructure and electronic energy levels of materials leading to significant modification of properties. Here we report enhancement of ammonia () sensitivity of thin films subjected to high-energy ion irradiation. Sol-gel-derived thin films (100 nm thickness) were exposed to 75 MeV ion irradiation, and the gas response characteristics of irradiated films were studied as a function of ion fluence. The irradiated films showed -type conductivity with a much higher response to compared to other gases such as ethanol. The observed enhancement of sensitivity is discussed in context of ion beam generated electronic states in the thin films.