Synthesis of Nanostructured Nanoclay-Zirconia Multilayers: a Feasibility Study
Figure 8
Thickness versus the number of deposition cycles for
(a) as-deposited and (b) annealed films made by ZrAc4 precursor solutions. In
(a), it is
assumed that open circles represent measurement artifacts (as-deposited films
where the part of layered films peeled off during cleaving of the substrates). Error
bars represent the data range. Lines represent the best linear fits.
