Journal of Nanomaterials / 2009 / Article / Fig 3

Research Article

Si Incorporation in InP Nanowires Grown by Au-Assisted Molecular Beam Epitaxy

Figure 3

(a) TEM image for zone axis of Si-doped InP NWs; (b) high magnification bright field STEM image; (c) STEM HAADF image of the same zone as (b). Black arrows in (b) and (c) indicate the position of stacking faults.
435451.fig.003a
(a)
435451.fig.003b
(b)
435451.fig.003c
(c)

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