Journal of Nanomaterials / 2009 / Article / Fig 3

Research Article

Si Incorporation in InP Nanowires Grown by Au-Assisted Molecular Beam Epitaxy

Figure 3

(a) TEM image for zone axis of Si-doped InP NWs; (b) high magnification bright field STEM image; (c) STEM HAADF image of the same zone as (b). Black arrows in (b) and (c) indicate the position of stacking faults.

We are committed to sharing findings related to COVID-19 as quickly and safely as possible. Any author submitting a COVID-19 paper should notify us at to ensure their research is fast-tracked and made available on a preprint server as soon as possible. We will be providing unlimited waivers of publication charges for accepted articles related to COVID-19. Sign up here as a reviewer to help fast-track new submissions.