Synthesis and Characterization of Upconversion Fluorescent , Doped Cs Nano- and Microcrystals
Figure 1
(a): A line pattern of orthorhombic file number PDF 28-01-086-2454 (b): Observed X-ray powder diffraction profile of the heat treated sample of : 78% , 20% , 2.0% (grey line), Rietveld fit (black line) and residuum, (c): observed X-ray powder diffraction profile of the microwave generated sample of : 78% , 20% , 2.0% Er (grey line), Rietveld fit (black line) and residuum, (d): observed X-ray powder diffraction profile of 78% , 20% , 2.0% generated in HEEDA (grey line), Rietveld fit (black line) and residuum.