Research Article

Synthesis and Characterization of Upconversion Fluorescent , Doped Cs Nano- and Microcrystals

Figure 1

(a): A line pattern of orthorhombic file number PDF 28-01-086-2454 (b): Observed X-ray powder diffraction profile of the heat treated sample of : 78%   , 20%   , 2.0%   (grey line), Rietveld fit (black line) and residuum, (c): observed X-ray powder diffraction profile of the microwave generated sample of : 78%   , 20%   , 2.0%  Er (grey line), Rietveld fit (black line) and residuum, (d): observed X-ray powder diffraction profile of 78%   , 20%   , 2.0%   generated in HEEDA (grey line), Rietveld fit (black line) and residuum.
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