Origin of the Difference in the Resistivity of As-Grown Focused-Ion- and Focused-Electron-Beam-Induced Pt Nanodeposits

<table>Representation of the resistance as a function of the inverse of thickness for one selected FEBID Pt nanowire and one selected FIBID Pt nanowire, which illustrates that the constant value expected if the Ohm-law applies only occurs for the FIBID Pt deposits above <i>≈</i>100 nm.</table>

Journal of Nanomaterials

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Figure 4

Figure 4: Origin of the Difference in the Resistivity of As-Grown Focused-Ion- and Focused-Electron-Beam-Induced Pt Nanodeposits 