Journal of Nanomaterials / 2009 / Article / Fig 4

Research Article

Origin of the Difference in the Resistivity of As-Grown Focused-Ion- and Focused-Electron-Beam-Induced Pt Nanodeposits

Figure 4

Representation of the resistance as a function of the inverse of thickness for one selected FEBID Pt nanowire and one selected FIBID Pt nanowire, which illustrates that the constant value expected if the Ohm-law applies only occurs for the FIBID Pt deposits above 100 nm.
936863.fig.004

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