Journal of Nanomaterials / 2009 / Article / Fig 9

Research Article

Origin of the Difference in the Resistivity of As-Grown Focused-Ion- and Focused-Electron-Beam-Induced Pt Nanodeposits

Figure 9

Average Pt atomic content (measured by EDX) versus the incident beam energy used for the growth in the investigated (a) FEBID deposits and (b) FIBID deposits. In this last case the Ga content is also shown. An incident electron beam energy of 10 kV was always used for the EDX experiments.
936863.fig.009a
(a) FEBID
936863.fig.009b
(b) FIBID

We are committed to sharing findings related to COVID-19 as quickly as possible. We will be providing unlimited waivers of publication charges for accepted research articles as well as case reports and case series related to COVID-19. Review articles are excluded from this waiver policy. Sign up here as a reviewer to help fast-track new submissions.