Research Article
Electrical Crystallization Mechanism and Interface Characteristics of Nanowire ZnO/Al Structures Fabricated by the Solution Method
Figure 5
XRD patterns of specimens. (a) ZnO/Al/SiO2/Si (un-nanowires), (b) ZnO NWs-ZnO/Al/SiO2/Si (un-EIC), (c) EIC process testing 10 mins, ZnO NWs-ZnO/Al/SiO2/Si (EIC 10 min), (d) ZnO NWs-ZnO/Al/SiO2/Si (EIC for 1 hour).