Journal of Nanomaterials / 2012 / Article / Fig 4

Research Article

Optical and Structural Properties of Silicon Nanocrystals Embedded in SiOx Matrix Obtained by HWCVD

Figure 4

(a) HRTEM images of the samples grown at 900°C and 1000°C, (b) histograms corresponding to the samples grown at 900 and 1000°C.

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