Challenges Found When Patterning Semiconducting Polymers with Electric Fields for Organic Solar Cell Applications

Figure 3

Atomic force microscope (AFM) images of (a) polystyrene (PS) and (c) MEH-PPV films after EHP using the same experimental conditions. Optical microscope image (b) of the patterned PS film. (d) Cross-section height profile of the MEH-PPV film shown in (c).