Orientation of One-Dimensional Silicon Polymer Films Studied by X-Ray Absorption Spectroscopy

<table>Si 1s narrow scan XP spectra for the PDMS films evaporated on HOPG surface with different thickness. The molecular formula of the PDMS is also shown in the figure in which the molecular weight is around 2000, and the number of silicon atoms (<svg height="7.9499998" id="M9" style="vertical-align:-0.1638pt" version="1.1" viewbox="0 0 8.6625004 7.9499998" width="8.6625004" xmlns="http://www.w3.org/2000/svg" xmlns:xlink="http://www.w3.org/1999/xlink">
<g transform="matrix(.017,0,0,-.017,.062,7.675)"><path d="M495 86q-46 -47 -87 -72.5t-63 -25.5q-43 0 -16 107l49 210q7 34 8 50.5t-3 21t-13 4.5q-35 0 -109.5 -72.5t-115.5 -140.5q-21 -75 -38 -159q-50 -10 -76 -21l-6 8l84 340q8 35 -4 35q-17 0 -67 -46l-15 26q44 44 85.5 70.5t64.5 26.5q35 0 10 -103l-24 -98h2
q42 56 97 103.5t96 71.5q46 26 74 26q9 0 16 -2.5t14 -11.5t9.5 -24.5t-1 -44t-13.5 -68.5q-30 -117 -47 -200q-4 -19 -3.5 -25t6.5 -6q21 0 70 48z" id="x1D45B"></path></g>
</svg>) is about 28. The sample surface was excited by the SR beam of 2.2 keV photons as an excitation source and the spectra were taken at the step energy of 0.07 eV. </table>

Journal of Nanomaterials

fig2

Figure 2

Figure 2: Orientation of One-Dimensional Silicon Polymer Films Studied by X-Ray Absorption Spectroscopy 